Call for Papers   Graph Models for Learning and Recognition (GMLR) Track The 38th ACM Symposium on Applied Computing (SAC 2023)                March 27 – April 2, 2023, Tallinn, Estonia                               http://phuselab.di.unimi.it/GMLR2023   Important Dates =============== Submission of regular papers:                                  October 1, 2022 October 15, 2022 Notification of acceptance/rejection:                    November 19, […]

The IEEE Biometrics Council invites participants to the upcoming (free) webinar by Prof. Hany Farid on “Combating Deep Fakes”. Detail on the webinar are given below: Title: Combatting Deep Fakes Speaker: Prof. Hany Farid , University of California, Berkeley, USA When: 12 October 2022, at 10am PT (1 pm EST, 7pm CEST) Where: Online (Zoom) […]

8th INTERNATIONAL SCHOOL ON DEEP LEARNING DeepLearn 2023 Winter Bournemouth, UK January 16-20, 2023 https://irdta.eu/deeplearn/2023wi/ *********** Co-organized by: Department of Computing and Informatics Bournemouth University Institute for Research Development, Training and Advice – IRDTA Brussels/London ****************************************************************** Early registration: October 24, 2022 ****************************************************************** SCOPE: DeepLearn 2022 Winter will be a research training event with a global […]

ACM Launches Journal on Autonomous Transportation Systems The potential of autonomous cars, buses and trucks to revolutionize transportation and society is one of the most anticipated subjects in technology. Several companies have already developed working prototypes of autonomous vehicles and billions of dollars have been invested in research and development. At the same time, important […]

The IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) 2023, to be held in Hawaii, USA in January 2023, will host 13 workshops on different topics with paper submission deadlines in October and November 2022. Accepted papers will be published as part of the WACV 2023 workshop proceedings and will appear in IEEE Xplore. […]